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| PHYS 23603 - Scanning Probe Microscopy |
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Credit Hours: 1.00. Scanning Probe Microscopy is a course that will introduce students to various types of scanning probe microscopy. We will cover techniques such as atomic force microscopy (AFM), near-field optical microscopy (NSOM) and scanning tunneling microscopy (STM). We will discuss how one uses these instruments to characterize materials and study their mechanical properties. The course will start with fundamental concepts such as simple harmonic motion and mechanical stress in materials demystify the complexities of various scanning probe microscopes. There will be various hands on activities that will allow students to investigate many of the fundamental concepts discussed. Typically offered Fall Spring Summer.
1.000 Credit hours Syllabus Available Levels: Undergraduate, Graduate, Professional Schedule Types: Distance Learning, Lecture Offered By: Regional Campus Only Course Attributes: Lower Division May be offered at any of the following campuses: PU Fort Wayne Learning Outcomes: 1. Understand fundamentally driven harmonic oscillators and stressed cantilevers. Explain how one uses these ideas to measure forces. 2. Understand how one is able to use the probe/sample interaction to map a surface of a given material. 3. Explain the basic principles behind atomic force microscopy and scanning tunneling microscopy. 4. Present the advantages and disadvantages to both atomic force and scanning tunneling microscopy. |
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